Compositional and Topographical Analysis of Electronic and Magnetic Film Materials using Scanning Electron Microscopy
Date
2000-12
Authors
Matheaus, Michael L.
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
No abstract prepared.
Description
Keywords
scanning electron microscopy, integrated circuits, semiconductors, magnetic films, microelectronics, x-ray microanalysis
Citation
Matheaus, M. L. (2000). Compositional and topographical analysis of electronic and magnetic film materials using scanning electron microscopy (Unpublished thesis). Southwest Texas State University, San Marcos, Texas.