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dc.contributor.advisorGutierrez, Carlos J.
dc.contributor.authorWhite, Nelson W. ( )
dc.date.accessioned2020-10-16T16:32:41Z
dc.date.available2020-10-16T16:32:41Z
dc.date.issued2005-05
dc.identifier.citationWhite, N. W. (2005). An investigation of focused ion beam micromachining (Unpublished thesis). Texas State University-San Marcos, San Marcos, Texas.
dc.identifier.urihttps://digital.library.txstate.edu/handle/10877/12786
dc.description.abstractNo abstract prepared.
dc.formatText
dc.format.extent82 pages
dc.format.medium1 file (.pdf)
dc.language.isoen
dc.subjectFocused ion beams
dc.subjectMicromachining
dc.subjectSemiconductors
dc.titleAn investigation of focused ion beam micromachining
txstate.documenttypeThesis
dc.contributor.committeeMemberGeerts, Wilhemus J.
dc.contributor.committeeMemberMichalk, Victor E.
thesis.degree.departmentPhysics
thesis.degree.grantorTexas State University--San Marcos
thesis.degree.levelMasters
thesis.degree.nameMaster of Science
txstate.accessrestricted
dc.description.departmentPhysics


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