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dc.contributor.authorPetersen, John E. ( )
dc.contributor.authorTwaglrayezu, Fidele ( )
dc.contributor.authorScolfaro, Luisa M. ( )
dc.contributor.authorBorges, Pablo D. ( Orcid Icon 0000-0003-3829-5134 )
dc.contributor.authorGeerts, Wilhelmus J. ( )
dc.date.accessioned2019-04-09T17:53:35Z
dc.date.available2019-04-09T17:53:35Z
dc.date.issued2017-02
dc.identifier.citationPetersen, J. E., Twagirayezu, F., Scolfaro, L. M., Borges, P. D. & Geerts, W. J., 2017, Electronic and optical properties of antiferromagnetic iron doped NiO - A first principles study. AIP Advances, 7, 055711.en_US
dc.identifier.urihttps://digital.library.txstate.edu/handle/10877/7964
dc.description.abstractAntiferromagnetic NiO is a candidate for next generation high-speed and scaled RRAM devices. Here, electronic and optical properties of antiferromagnetic NiO: Fe 25% in the rock salt structure are studied and compared to intrinsic NiO. From density of states and complex dielectric function analysis, the first optical transition is found to be at lower frequency than intrinsic NiO due to an Fe impurity level being the valence band maximum. The resulting effects on refractive index, reflectivity, absorption, optical conductivity and loss function for Fe-doped NiO are compared to those of intrinsic NiO, and notable differences are analyzed. The electronic component of the static dielectric constant of NiO: Fe 25% is calculated to be about 2% less than that of intrinsic NiO.en_US
dc.formatText
dc.format.extent5 pages
dc.format.medium1 file (.pdf)
dc.language.isoen
dc.publisherAIP Publishingen_US
dc.sourceAIP Advances, 2017, Vol. 7, Article 055711.
dc.subjectAntiferromagnetic ironen_US
dc.subjectNiOen_US
dc.subjectElectronic propertiesen_US
dc.subjectOptical propertiesen_US
dc.titleElectronic and Optical Properties of Antiferromagnetic Iron Doped NiO - A First Principles Studyen_US
dc.typepublishedVersion
txstate.documenttypeArticle
dc.identifier.doihttp://dx.doi.org/10.1063/1.4975493
dc.rights.licenseCreative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.
dc.description.departmentPhysics


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