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dc.contributor.authorHancock, Bobby L. ( )
dc.contributor.authorHoltz, Mark ( Orcid Icon 0000-0001-9524-964X )
dc.date.accessioned2019-05-20T21:08:18Z
dc.date.available2019-05-20T21:08:18Z
dc.date.issued2014-11-12
dc.identifier.citationHancock, B. L. & Holtz, M. (2014). Straightforward electrical measurement of forward-voltage to investigate thermal effects in InGaN/GaN high-brightness light-emitting diodes. Journal of Vacuum Science and Technology. 32(6).en_US
dc.identifier.urihttps://digital.library.txstate.edu/handle/10877/8205
dc.description.abstractThe junction temperature of InGaN/GaN MQW high-brightness light-emitting diodes is measured using an electrical method based on the dependence of diode forward voltage, Vƒ, on the junction temperature Tj. Electroluminescence (EL) data collected during this measurement are presented and used to compare the efficacy of this method for measuring Tj to the electrical technique. In devices based on polar III-nitride materials, the temperature dependence of the EL peak energy is obscured by carrier screening and bandfilling; the contributions of these effects are explored and presented. Additionally, the experimental method presented offers an application for extrapolating a thermal relaxation time during the junction temperature measurement. The results from this thermal time constant study are presented and discussed.en_US
dc.formatText
dc.format.extent6 pages
dc.format.medium1 file (.pdf)
dc.language.isoen
dc.publisherAmerican Vacuum Societyen_US
dc.sourceJournal of Vacuum Science and Technology B, 2014, Vol. 32, Issue 6.
dc.subjectElectroluminescenceen_US
dc.subjectElectric measurementsen_US
dc.subjectSemiconductorsen_US
dc.subjectNitridesen_US
dc.subjectVoltmeteren_US
dc.subjectThermal conductivityen_US
dc.titleStraightforward Electrical Measurement of Forward-voltage to Investigate Thermal Effects in InGaN/GaN High-brightness Light-emitting Diodesen_US
dc.typepublishedVersion
txstate.documenttypeArticle
dc.identifier.doihttp://dx.doi.org/10.1116/1.4901411
txstate.departmentPhysics


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