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dc.contributor.authorAyala, Anival ( )
dc.date.accessioned2019-11-26T13:30:12Z
dc.date.available2019-11-26T13:30:12Z
dc.date.issued2000-12
dc.identifier.citationAyala, A. (2000). Advanced X-ray characterization of ULSI materials (Unpublished thesis). Southwest Texas State University, San Marcos, Texas.
dc.identifier.urihttps://digital.library.txstate.edu/handle/10877/8918
dc.description.abstractNo abstract prepared.
dc.formatText
dc.format.extent92 pages
dc.format.medium1 file (.pdf)
dc.language.isoen_US
dc.subjectIntegrated circuits
dc.subjectSemiconductors
dc.subjectIntegrated circuits
dc.subjectX-rays--Industrial applications
dc.subjectX-rays--Diffraction
dc.subjectThin-film circuits
dc.subjectSemiconductor films
dc.subjectUltra large scale integration
dc.subjectDesign and construction
dc.titleAdvanced X-ray Characterization of ULSI materials
txstate.documenttypeThesis
thesis.degree.departmentPhysics
thesis.degree.grantorSouthwest Texas State University
thesis.degree.levelMasters
thesis.degree.nameMaster of Science
txstate.accessrestricted
txstate.departmentPhysics


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