An investigation of focused ion beam micromachining
dc.contributor.advisor | Gutierrez, Carlos J. | |
dc.contributor.author | White, Nelson W. | |
dc.contributor.committeeMember | Geerts, Wilhemus J. | |
dc.contributor.committeeMember | Michalk, Victor E. | |
dc.date.accessioned | 2020-10-16T16:32:41Z | |
dc.date.available | 2020-10-16T16:32:41Z | |
dc.date.issued | 2005-05 | |
dc.description.abstract | No abstract prepared. | |
dc.description.department | Physics | |
dc.format | Text | |
dc.format.extent | 82 pages | |
dc.format.medium | 1 file (.pdf) | |
dc.identifier.citation | White, N. W. (2005). An investigation of focused ion beam micromachining (Unpublished thesis). Texas State University-San Marcos, San Marcos, Texas. | |
dc.identifier.uri | https://hdl.handle.net/10877/12786 | |
dc.language.iso | en | |
dc.subject | focused ion beams | |
dc.subject | micromachining | |
dc.subject | semiconductors | |
dc.title | An investigation of focused ion beam micromachining | |
dc.type | Thesis | |
thesis.degree.department | Physics | |
thesis.degree.grantor | Texas State University-San Marcos | |
thesis.degree.level | Masters | |
thesis.degree.name | Master of Science |
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