Electrical and Optical Properties of RRAM

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dc.contributor.advisorGeerts, Wilhelmus
dc.contributor.authorCui, Yubo
dc.contributor.committeeMemberSmith, Casey
dc.contributor.committeeMemberZakhidov, Alexander
dc.date.accessioned2016-11-07T21:52:18Z
dc.date.available2016-11-07T21:52:18Z
dc.date.issued2016-08
dc.description.abstractRecently several electronic devices have achieved significant enhancements that have been attributed to an oxidized NiFe layer. A study on lateral spin valves, was found to have an increased magnetoresistance after leaving it exposed to air. The enhancements were attributed to the partly oxidation of a NiFe layer [1]. Even more recently the turn on voltages of Hematite based water splitting devices was lowered to record low of .61 V with the addition of an amorphous NiFeOx layer [1]. We investigated the optical properties of NixFe1-x-oxide thin films that were deposited by reactive RF sputtering on different substrates. Deposition was performed in an AJA Magnetron System using a gas flow of 10 sccm and a sputter pressure of 10-3 Torr. NixFe1-xOxide films were made for different substrate temperatures (room temperature-588 degrees Celsius), different deposition times (38-1200s), and different Oxygen flow rates (5-20%). Films with two different Fe concentrations were studied (10-19 at.%). The optical properties of the films from the UV to the far IR were studied by ellipsometer as a function of the deposition parameters. The electrical properties were studied by the linear four-point probe technique. Chemical composition, morphology and roughness were studied by EDAX, SEM, and AFM. In addition, three real RRAM memory cell device test wafers were made.
dc.description.departmentPhysics
dc.formatText
dc.format.extent187 pages
dc.format.medium1 file (.pdf)
dc.identifier.citationCui, Y. (2016). <i>Electrical and optical properties of RRAM</i> (Unpublished thesis). Texas State University, San Marcos, Texas.
dc.identifier.urihttps://hdl.handle.net/10877/6342
dc.language.isoen
dc.subjectPyO
dc.subjectRRAM
dc.subjectElectrical and optical properties
dc.subject.lcshNonvolatile random-access memoryen_US
dc.subject.lcshThin films--Design and constructionen_US
dc.subject.lcshNanostructured materialsen_US
dc.subject.lcshNanoscienceen_US
dc.titleElectrical and Optical Properties of RRAM
dc.typeThesis
thesis.degree.departmentPhysics
thesis.degree.disciplineMaterials Physics
thesis.degree.grantorTexas State University
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

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