High Intensity X-ray Characterization Strategies for Evaluating Nanomaterials

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dc.contributor.authorFritz, Shannon G.
dc.date.accessioned2020-05-11T15:35:45Z
dc.date.available2020-05-11T15:35:45Z
dc.date.issued2003-12
dc.description.abstractNo abstract prepared.
dc.description.departmentPhysics
dc.formatText
dc.format.extent60 pages
dc.format.medium1 file (.pdf)
dc.identifier.citationFritz, S. G. (2003). High intensity x-ray characterization strategies for evaluating nanomaterials (Unpublished thesis). Texas State University-San Marcos, San Marcos, Texas.
dc.identifier.urihttps://hdl.handle.net/10877/9852
dc.language.isoen
dc.subjectnanostructured materials
dc.subjectx-rays diffraction
dc.subjectnanotechnology
dc.titleHigh Intensity X-ray Characterization Strategies for Evaluating Nanomaterials
dc.typeThesis
thesis.degree.departmentPhysics
thesis.degree.grantorTexas State University-San Marcos
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

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