CV and DLTS Analysis of Materials for Microelectronic Applications

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dc.contributor.advisorGeerts, Wilhelmus J.
dc.contributor.authorLohn, Christopheren_US
dc.contributor.committeeMemberGolding, Terry
dc.contributor.committeeMemberVentrice, Carl A.
dc.date.accessioned2012-02-24T10:20:35Z
dc.date.available2012-02-24T10:20:35Z
dc.date.issued2008-05en_US
dc.description.abstractNo abstract prepared.
dc.description.departmentPhysics
dc.formatText
dc.format.extent253 pages
dc.format.medium1 file (.pdf)
dc.identifier.citationLohn, C. (2008). <i>CV and DLTS analysis of materials for microelectronic applications</i> (Unpublished thesis). Texas State University-San Marcos, San Marcos, Texas.
dc.identifier.urihttps://hdl.handle.net/10877/4018
dc.language.isoen
dc.subjectDLTSen_US
dc.subjectDeep level transient spectroscopyen_US
dc.titleCV and DLTS Analysis of Materials for Microelectronic Applicationsen_US
dc.typeThesis
thesis.degree.departmentPhysics
thesis.degree.disciplineMaterials Physics
thesis.degree.grantorTexas State University-San Marcos
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

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