Thickness Measurement of Multilayer Film Stackin Perovskite Solar Cell Using Spectroscopicellipsometry

Simple item page
dc.contributor.authorHasan, Mehedhi
dc.contributor.authorLyon, Kevin
dc.contributor.authorTrombley, Lauren
dc.contributor.authorSmith, Casey
dc.contributor.authorZakhidov, Alex
dc.date.accessioned2020-03-03T17:56:55Z
dc.date.available2020-03-03T17:56:55Z
dc.date.issued2019-12
dc.description.abstractThe rapid surge in perovskite solar cell efficiency has necessitated the development of viable metrology techniques during device integration, paving the way for commercialization. Ellipsometry is considered the most appropriate technique for fast and accurate thickness measurement for large scale production. However, a precise and well-calibrated model is a prerequisite for this technique. While ellipsometry of individual device layers has been reported in recent perovskite literature, a comprehensive multilayer modeling approach is thus far unavailable. Perovskite optoelectronic devices generally consist of a six-layer film stack with three transparent layers required for optical absorption in the perovskite layer. Spin casted thin films, now common in this line of research, impart their own difficulties into ellipsometric modeling. Roughnesses at each heterointerface, similarities in optical spectra of transparent layers, and anomalous dispersion of perovskite are just a few of such challenges. In this work, we report the process of building an ellipsometry model from scratch for thickness measurement of methylammonium lead iodide (MAPI) perovskite and indium tin oxide (ITO)/hole transport layer (HTL) bilayer thin film stacks on a glass substrate. Three promising representatives of HTLs (CuI, Cu<sub>2</sub>O, and PEDOT:PSS) were studied. The models were extended to measure the individual layer thicknesses of the MAPI/HTL/ITO film stack on a glass substrate using the models developed for individual layers. Optical constants of all the representative thin films were thus extracted for a wide wavelength range (300 nm–900 nm).
dc.description.departmentMaterials Science, Engineering, and Commercialization
dc.formatText
dc.format.extent6 pages
dc.format.medium1 file (.pdf)
dc.identifier.citationHasan, M., Lyon, K., Trombley, L., Smith, C., & Zakhidov, A. (2019). Thickness measurement of multilayer film stack in perovskite solar cell using spectroscopic ellipsometry. AIP Advances, 9(12).
dc.identifier.doihttps://doi.org/10.1063/1.5125686
dc.identifier.issn2158-3226
dc.identifier.urihttps://hdl.handle.net/10877/9343
dc.language.isoen
dc.publisherAIP Publishing
dc.rights.holder© 2019 Author(s).
dc.rights.licenseThis work is licensed under a Creative Commons Attribution 4.0 International License.
dc.sourceAIP Advances, (2019), Vol. 9, No. 12.
dc.subjectperovskite solar cell
dc.subjectspectroscopic ellipsometry
dc.titleThickness Measurement of Multilayer Film Stackin Perovskite Solar Cell Using Spectroscopicellipsometry
dc.typeArticle

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
1.5125686.pdf
Size:
2.14 MB
Format:
Adobe Portable Document Format
Description:
Download

License bundle

Now showing 1 - 2 of 2
No Thumbnail Available
Name:
license.txt
Size:
2.54 KB
Format:
Item-specific license agreed upon to submission
Description:
Download
No Thumbnail Available
Name:
PERMISSION-AIP-Publishing.pdf
Size:
109.97 KB
Format:
Adobe Portable Document Format
Description:
Download

Collections

McCoy College of Business