Compositional and Topographical Analysis of Electronic and Magnetic Film Materials using Scanning Electron Microscopy

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dc.contributor.advisorGutierrez, Carlos J.
dc.contributor.authorMatheaus, Michael L.
dc.date.accessioned2020-07-08T20:43:44Z
dc.date.available2020-07-08T20:43:44Z
dc.date.issued2000-12
dc.description.abstractNo abstract prepared.
dc.description.departmentPhysics
dc.formatText
dc.format.extent148 pages
dc.format.medium1 file (.pdf)
dc.identifier.citationMatheaus, M. L. (2000). Compositional and topographical analysis of electronic and magnetic film materials using scanning electron microscopy (Unpublished thesis). Southwest Texas State University, San Marcos, Texas.
dc.identifier.urihttps://hdl.handle.net/10877/11998
dc.language.isoen
dc.subjectscanning electron microscopy
dc.subjectintegrated circuits
dc.subjectsemiconductors
dc.subjectmagnetic films
dc.subjectmicroelectronics
dc.subjectx-ray microanalysis
dc.titleCompositional and Topographical Analysis of Electronic and Magnetic Film Materials using Scanning Electron Microscopy
dc.typeThesis
thesis.degree.departmentPhysics
thesis.degree.grantorSouthwest Texas State University
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

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